DocumentCode :
348949
Title :
The “current driven model”-experimental verification and the contribution of Idd delta to digital device radiation
Author :
Dash, Glen ; Curtis, Jon ; Straus, Isidor
Author_Institution :
Ampyx, Acton, MA, USA
Volume :
1
fYear :
1999
fDate :
1999
Firstpage :
317
Abstract :
Several researchers have proposed that a primary source of emissions from digital devices is due to the partial inductance of the return trace on printed circuit boards. In this “current driven model,” RF currents derived from the nanosecond rise time of periodic signals such as clocks create a voltage across the return due to this inductance. This paper reports on an experimental verification of this model, but points out apparent limitations-at frequencies above a certain point, internal characteristics of integrated circuits such as Idd delta appear to dominate the emissions, at least in the circuits examined
Keywords :
MOS digital integrated circuits; printed circuits; radiofrequency interference; Idd delta; RF currents; clocks; current driven model; digital device radiation; integrated circuits; internal characteristics; nanosecond rise time; partial inductance; periodic signals; printed circuit boards; return trace; voltage; Capacitors; Clocks; Inductance; Integrated circuit modeling; Oscillators; Predictive models; Printed circuits; Testing; Voltage; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
Type :
conf
DOI :
10.1109/ISEMC.1999.812920
Filename :
812920
Link To Document :
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