DocumentCode :
34895
Title :
Optimal Checkpoint Selection with Dual-Modular Redundancy Hardening
Author :
Shin-Haeng Kang ; Hae-woo Park ; Sungchan Kim ; Hyunok Oh ; Soonhoi Ha
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Seoul Nat. Univ., Seoul, South Korea
Volume :
64
Issue :
7
fYear :
2015
fDate :
July 1 2015
Firstpage :
2036
Lastpage :
2048
Abstract :
With the continuous scaling of semiconductor technology, failure rate is increasing significantly so that reliability becomes an important issue in multiprocessor system-on-chip (MPSoC) design. We propose an optimal checkpoint selection with task duplication hardening to tolerate transient faults. A target application is specified in a task graph, and the schedule/checkpoint placements are determined at design time. The proposed optimal algorithm minimizes the checkpoint overhead with a latency constraint. Experimental results show that the proposed algorithm effectively reduces the minimum end-to-end latency to perform a fault-tolerant schedule. In addition, the proposed algorithm dramatically decreases the checkpointing overhead on uniprocessor and multiprocessor systems compared with a greedy approach and an equidistant algorithm.
Keywords :
integrated circuit design; integrated circuit reliability; logic design; radiation hardening (electronics); system-on-chip; checkpoint placement; dual modular redundancy hardening; end-to-end latency reduction; fault tolerant schedule; multiprocessor system-on-chip design; optimal checkpoint selection; task duplication hardening; task graph; transient fault tolerance; Checkpointing; Multiprocessing systems; Program processors; Redundancy; Schedules; Transient analysis; Checkpoint; multiprocessor; optimal algorithm; reliability; task graph;
fLanguage :
English
Journal_Title :
Computers, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9340
Type :
jour
DOI :
10.1109/TC.2014.2349492
Filename :
6880324
Link To Document :
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