Title :
Reflectivity calculation of a periodical-patch-loaded absorber by the FD-TD method
Author_Institution :
Commun. Res. Lab., Minist. of Posts & Telecommun., Koganei, Japan
Abstract :
An objective of this paper is to show low reflectivity of a lossy material with periodical metal patches on the surface by FD-TD computations in addition to experiments. Symmetry conditions based on image theory have been introduced to reduce the computational volume. A uniaxial perfectly-matched-layer (UPML) is used as an absorbing boundary condition, which also reduces computer memory and calculation time. By the computations and experiments, the absorber of this kind is proved to have low reflectivity as a viable microwave absorber. It features potential versatility of design
Keywords :
absorbing media; electromagnetic wave absorption; finite difference time-domain analysis; inhomogeneous media; microwave materials; reflectivity; FD-TD method; absorbing boundary condition; computational volume reduction; computer memory reduction; experiments; image theory; lossy material; microwave absorber; near to far field transformation; periodical metal patches; periodical-patch-loaded absorber; reflectivity calculation; symmetry conditions; uniaxial perfectly-matched-layer; Conductivity; Inorganic materials; Magnetic confinement; Message-oriented middleware; Permittivity; Polynomials; Reflection; Reflectivity; Strips; Surface waves;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812924
