Title :
1995 IEEE International SOI Conference Proceedings
Abstract :
The following topics were dealt with: device physics modeling, and characterization; process technology manufacturing; circuit applications; novel structures and application; material processing and characterization; material science
Keywords :
integrated circuit technology; semiconductor device models; semiconductor technology; silicon-on-insulator; SOI; circuit applications; device characterization; device modelling; device physics; material characterization; material processing; material science; process technology manufacturing;
Conference_Titel :
SOI Conference, 1995. Proceedings., 1995 IEEE International
Conference_Location :
Tucson, AZ, USA
Print_ISBN :
0-7803-2547-8
DOI :
10.1109/SOI.1995.526430
