Title :
Test facility uncertainty calculation methodology and rationale
Author :
Heise, Edward R. ; Heise, Robert E W
Author_Institution :
Eastman Kodak Co., Rochester, NY, USA
Abstract :
A uniform technique to compute the measurement uncertainty of powerline and radiated emission (EMI) tests is presented. This method recommends frequency sampling, traceability to “true values”, identifies systemic factors, and lists realistic values for computation of systemic uncertainty. Total emission test uncertainty can be calculated as a figure of merit (FOM) for relative assessment of the test facility
Keywords :
anechoic chambers (electromagnetic); electromagnetic interference; power cable testing; EMI test; figure of merit; frequency sampling; powerline emission; radiated emission tests; systemic factors; systemic uncertainty; test facility uncertainty calculation methodology; total emission test uncertainty; traceability; Calibration; Couplings; Frequency measurement; Impedance; Measurement standards; Measurement uncertainty; Receiving antennas; Signal generators; System testing; Test facilities;
Conference_Titel :
Electromagnetic Compatibility, 1999 IEEE International Symposium on
Conference_Location :
Seattle, WA
Print_ISBN :
0-7803-5057-X
DOI :
10.1109/ISEMC.1999.812929