• DocumentCode
    3489880
  • Title

    A method of extracting on-chip decoupling cap through board level

  • Author

    Tseng, P.M. ; Chang, Joseph ; Tsai, F.Y. ; Yeh, Cliff ; Chen, Spencer

  • Author_Institution
    Faraday Technol. Corp., Hsinchu
  • fYear
    2008
  • fDate
    16-20 Dec. 2008
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A method of extracting on-chip decoupling capacitance will benefit the SI/PI engineers to complete the models in PDN and this will enhance the accurate prediction of power integrity analysis. A methodology is proposed to extract and model the on-chip decoupling capacitance through the system board level, and good results were demonstrated.
  • Keywords
    capacitors; PDN; board level; onchip decoupling capactiance; power integrity analysis; Capacitance; Capacitors; Frequency; Impedance; Power distribution; Power system modeling; Semiconductor device noise; System-on-a-chip; Testing; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Conference, 2008. APMC 2008. Asia-Pacific
  • Conference_Location
    Macau
  • Print_ISBN
    978-1-4244-2641-6
  • Electronic_ISBN
    978-1-4244-2642-3
  • Type

    conf

  • DOI
    10.1109/APMC.2008.4958460
  • Filename
    4958460
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3489880