DocumentCode :
3489897
Title :
Thermal analysis automation system for semiconductor package
Author :
Zhang, Yuanxiang ; Liang, Lihua ; Xia, Yangjian ; Liu, Yong ; Irving, Scott ; Luk, Timwah
Author_Institution :
Fairchild-ZJUT Joint Lab., Zhejiang Univ. of Technol., Hangzhou
fYear :
2008
fDate :
20-23 April 2008
Firstpage :
1
Lastpage :
7
Abstract :
The technology of thermal analysis is very important in development of a new generation of IC package design, which aims to obtain the temperature distribution and thermal resistance of package. Most IC design engineers and package engineers have many difficulties in performing thermal analysis because they are familiar with the product structure but poor in thermal-physical modeling and FEA skills. To assist IC design engineers and package engineers to perform thermal analysis efficiently and accurately, a fully automation system (WBExcel) that has the ability to complete the whole package thermal analysis automatically has been developed based on ANSYSreg Workbench and Excel. The WBExcel consist of four modules: a Package Model Information Library, an executable Wizard System, a Package Material Library and an Environment Library. The general methodology of developing this automation system is introduced. The application on PCB level analysis and component level analysis is presented and indicates the reliability and efficiency of WBExcel.
Keywords :
integrated circuit packaging; printed circuits; semiconductor device packaging; temperature measurement; ANSYS Workbench; IC design; IC package design; PCB level analysis; WBExcel automation system; Wizard System; environment library; package material library; package model information library; semiconductor package; temperature distribution; thermal analysis automation system; thermal resistance; thermal-physical modeling; Automation; Design engineering; Integrated circuit modeling; Integrated circuit packaging; Libraries; Performance analysis; Semiconductor device packaging; Temperature distribution; Thermal engineering; Thermal resistance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location :
Freiburg im Breisgau
Print_ISBN :
978-1-4244-2127-5
Electronic_ISBN :
978-1-4244-2128-2
Type :
conf
DOI :
10.1109/ESIME.2008.4525028
Filename :
4525028
Link To Document :
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