Title :
Characterization of a wideband digitizer for power measurements up to 1 MHz
Author :
Rietveld, G. ; Kramer, C. ; Houtzager, E. ; Kristensen, O. ; Zhao, D. ; de Leffe, C. ; Lippert, T.
Author_Institution :
VSL, Delft, Netherlands
Abstract :
A commercial two-channel high-speed digitizer is extensively characterized in the frequency range of 50 Hz to 1 MHz. The measurements involve flatness, linearity, phase, and the effects of loading, dc offsets, and temperature. The results indicate that the digitizer can be applied in wideband power measurements with an uncertainty better than 1% at 1 MHz.
Keywords :
power measurement; frequency 50 Hz to 1 MHz; two-channel high-speed digitizer; wideband digitizer; wideband power measurements; Electromagnetic measurements; Finite impulse response filter; Frequency measurement; Linearity; Phase measurement; Power measurement; Temperature; Transformers; Voltage; Wideband;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5545044
