Advancement in cermet thick film technology for dry circuit applications

Author

Bolin, R.M. ; Bosze, Wayne P.

Author_Institution

Bourns Inc., Riverside, CA, USA

fYear

1988

fDate

26-29 Sept. 1988

Firstpage

251

Lastpage

255

Abstract

The primary limiting factor of the variable resistors presently available for operation in the low microampere range is output instability as a result of changes in contact resistance. These changes result from nonconductive films and dielectrics forming over time between the resistor element and wiper contact. The authors discuss a novel cermet technology that greatly reduces the effects of contact resistance, namely, recently developed Palirium system that improves output stability by creating a precious metal to metal contact point between the resistor´s element and the wiper.<>

Keywords

cermets; contact resistance; electrical contacts; potentiometers; stability; thick film resistors; Palirium system; cermet thick film technology; changes in contact resistance; contact resistance stability; dielectrics forming over time; dry circuit applications; low microampere range; nonconductive films; novel cermet technology; operation; output instability; output stability; precious metal to metal contact; primary limiting factor; resistor element; variable resistors; wiper contact; wiper resistor element contacts; Ceramics; Circuit stability; Contact resistance; Dielectric films; Impedance; Integrated circuit technology; Resistors; Thick film circuits; Thick films; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on

Conference_Location

San Francisco, CA, USA

Type

conf

DOI

10.1109/HOLM.1988.16125

Filename

16125