The General Principles on Shaping of the Test Tasks of the Matrix Type of the More Low Order on Base of the Complex Test Compositions

In the article the procedure for the shaping the test tasks of the matrix type of the more low order on the base of the complex test composition of the matrix type is investigated. For example on the test task (semiconductor diodes), general approaches on making the correct new structures are considered. In the article happens to logistical scheme, which appears the simplified variant for the decision of the task on correspondence. The studies of the new structures on insufficiency, sufficiency and redundancy ensembles are conducted