A novel index of identifying the P/G noise level through failure analysis

High switching transient yields a significant impact on supply noise for memory I/O interface and neighbor functional blocks. Combined with the indexes of PSRR, STEP and STOV, A novel power index, CCNP, could be introduced and demonstrated effectively for predicting supply noise margin. By means of the proposed methodology and power index, a fast and accurately simulation based prediction will be made to benefit the simulation of high speed simultaneously switching supply coupled noise.