Title :
Resistance and attenuation formulas of microstripline constructed by inspection and compared to results from different softwares
Author :
Che, Wenquan ; Tang, Yufang ; Vietzorreck, Larissa ; Chow, Y. Leonard
Author_Institution :
Nanjing Univ. of Sci. & Technol., Nanjing
Abstract :
This paper shows that the formulas of the resistance and attenuation of the microstrip line may still be constructed by inspection, with the added Ampere´s law and the propagation of slow wave.
Keywords :
dispersion (wave); electric resistance; microstrip lines; Ampere´s law; attenuation formulas; microstripline; resistance formulas; slow wave propagation; Attenuation; Circuits; Copper; Equations; Inspection; Microstrip; Radio frequency; Roentgenium; Skin; Strips;
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
DOI :
10.1109/APMC.2008.4958472
