DocumentCode :
3490094
Title :
Detection of single-charge polarisation in silicon double quantum dots by using serially-connected multiple single-electron transistors
Author :
Kawata, Yoshiyuki ; Oda, Shunri ; Tsuchiya, Yoshishige ; Mizuta, Hiroshi
Author_Institution :
Quantum Nanoelectron. Res. Center, Tokyo Inst. of Technol., Tokyo
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
322
Lastpage :
325
Abstract :
We investigate novel serially-connected multiple single-electron transistors (MSETs) as a single-charge polarisation readout for silicon integrated charge qubits. We first design and analyse the double single-electron transistors (DSETs) in which double quantum dots are connected in series with two side gates. We show that the DSETs are sufficiently sensitive to distinguish all the single-charge polarisation states on the two charge qubits integrated adjacently. We also show the scalability of the MSETs by extending our analysis to a scaled-up system of serial triple single-electron transistors (TSETs) integrated with triple charge qubits. Finally we fabricate the DSETs with double charge qubits on the silicon-on-insulator substrate and observe hysteresis in the Coulomb oscillations of the tunnel current at temperature of 4.2 K, which are attributable to the change of polarisation in the double charge qubits.
Keywords :
elemental semiconductors; semiconductor device models; semiconductor quantum dots; silicon; single electron transistors; Coulomb oscillations; Si; double quantum dots; hysteresis; serially-connected multiple single-electron transistors; silicon integrated charge qubits; silicon-on-insulator substrate; single-charge polarisation readout; tunnel current; Capacitance; Circuit simulation; Computational modeling; Electrodes; Hysteresis; Polarization; Quantum computing; Quantum dots; Silicon on insulator technology; Single electron transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Device Research Conference, 2008. ESSDERC 2008. 38th European
Conference_Location :
Edinburgh
ISSN :
1930-8876
Print_ISBN :
978-1-4244-2363-7
Electronic_ISBN :
1930-8876
Type :
conf
DOI :
10.1109/ESSDERC.2008.4681763
Filename :
4681763
Link To Document :
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