Title :
High frequency asymptotic analysis of modal excitation at flanged parallel plane waveguides
Author :
Abe, Yuji ; Shirai, Hiroshi ; Sato, Ryoichi
Author_Institution :
Grad. Sch. of Sci. & Eng., Chuo Univ., Tokyo, Japan
Abstract :
Ray analysis has been executed for obtaining modal excitation coefficients at the flanged parallel plane waveguides. Previously derived formula has been extended to include multiple edge diffraction contributions between the aperture edges. By comparing the results by other methods, it has been shown that the contribution due to the doubly edge diffracted rays can improve the excitation coefficients for the transitional waveguide mode.
Keywords :
electromagnetic wave diffraction; electromagnetic wave scattering; waveguides; aperture edges; doubly edge diffracted rays; electromagnetic scattering; excitation coefficients; flanged parallel plane waveguides; high frequency asymptotic analysis; modal excitation; modal excitation coefficients; multiple edge diffraction; ray analysis; transitional waveguide mode; Couplings; Diffraction; Educational institutions; Electromagnetic scattering; Planar waveguides;
Conference_Titel :
Communications and Electronics (ICCE), 2012 Fourth International Conference on
Conference_Location :
Hue
Print_ISBN :
978-1-4673-2492-2
DOI :
10.1109/CCE.2012.6315932