DocumentCode :
3490255
Title :
Optimization of high density interconnections (HDI) printed circuit boards robustness
Author :
Chaillot, A. ; Maire, O. ; Munier, C. ; Tonnelier, L. ; Chastanet, C.
Author_Institution :
EADS France Innovation Work, Suresnes
fYear :
2008
fDate :
20-23 April 2008
Firstpage :
1
Lastpage :
8
Abstract :
This document provides a first "how-to" guide for modelling thermo-mechanical behaviour of an HDI board submitted to reflow process using finite element modelling (FEM). The parametric model constructed here includes microvias, buried vias and plated through holes (PTH). The HDI board is composed of a central core and two micro via layers on each external side. Firstly, equivalent material properties of the complete stack-up were determined according to three pre-preg materials (mat. A as ref., mat. B and mat. C) and core thickness (0.9, 1.1 and 1.3 mm as ref.) below and above their glass transition temperature, Tg. Several simulations were then done on the reference board in order to evaluate the impact of the temperature shock (above Tg) on the ageing of the HDI board. Finally, we focused on the behaviour of the buried via, which is a highly critic part of the HDI board. The objective was to optimize, for the different assembly processes (leaded and lead free), the choice of the FR4 material types as well as the design rules (core thickness and buried via diameter for example). Discussions on results in link with experimental data and calculation approximations are done in this study in order to better understand the failure roots and to determine way of simulation methodology improvements.
Keywords :
finite element analysis; glass transition; integrated circuit interconnections; printed circuits; FEM; core thickness; finite element modelling; glass transition temperature; high density interconnections; plated through holes; printed circuit boards robustness; thermomechanical behaviour; Environmentally friendly manufacturing techniques; Finite element methods; Integrated circuit interconnections; Material properties; Parametric statistics; Printed circuits; Robustness; Semiconductor device modeling; Temperature; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location :
Freiburg im Breisgau
Print_ISBN :
978-1-4244-2127-5
Electronic_ISBN :
978-1-4244-2128-2
Type :
conf
DOI :
10.1109/ESIME.2008.4525053
Filename :
4525053
Link To Document :
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