Title :
On-chip decoupling capacitor design to reduce switching-noise-induced instability in CMOS/SOI VLSI
Author :
Wang, L.K. ; Chen, Howard H.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Abstract :
The supply noise from the packaging of CMOS/SOI circuits can cause performance degradation, reliability reduction and even loss of circuit functionality due to the device latch-up problem. By properly adding on-chip decoupling capacitors in the proximity of the circuitry, we can effectively alleviate the switching noise problem and improve the performance of CMOS/SOI circuits
Keywords :
CMOS integrated circuits; MOS capacitors; VLSI; circuit stability; integrated circuit noise; interference suppression; silicon-on-insulator; CMOS/SOI ICs; CMOS/SOI VLSI; Si; onchip decoupling capacitor design; supply noise; switching noise suppression; switching-noise-induced instability; Capacitors; Circuit noise; Noise reduction; Parasitic capacitance; Power supplies; Silicon on insulator technology; Surges; Switching circuits; Very large scale integration; Voltage;
Conference_Titel :
SOI Conference, 1995. Proceedings., 1995 IEEE International
Conference_Location :
Tucson, AZ
Print_ISBN :
0-7803-2547-8
DOI :
10.1109/SOI.1995.526480
