DocumentCode :
3490333
Title :
An over 200-W output power GaN HEMT push-pull amplifier with high reliability
Author :
Kikkawa, T. ; Maniwa, Toru ; Hayashi, H. ; Kanamura, M. ; Yokokawa, S. ; Nishi, M. ; Adachi, N. ; Yokoyama, M. ; Tateno, Y. ; Joshin, K.
Author_Institution :
Fujitsu Labs. Ltd., Kanagawa, Japan
Volume :
3
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
1347
Abstract :
We describe a state-of-the-art 250-W output power AlGaN/GaN HEMT push-pull transmitter amplifier operated at a drain bias voltage of 50 V. We also demonstrated stable operation under RF stress testing for 1000 h at a drain bias voltage of 60 V, for the first time. The amplifier, combined with a digital pre-distortion (DPD) system, also achieved an adjacent channel leakage power ratio (ACLR) of less than -50 dBc for 1-carrier W-CDMA signals with a drain supply voltage of 50 V. We show, for the first time, that an AlGaN/GaN HEMTs push-pull amplifier can fulfill the requirements of W-CDMA systems.
Keywords :
III-V semiconductors; aluminium compounds; code division multiple access; power HEMT; power amplifiers; semiconductor device manufacture; semiconductor device reliability; transmitters; 1000 h; 250 W; 50 V; 60 V; AlGaN-GaN; HEMT push-pull amplifier; RF stress testing; W-CDMA signals; W-CDMA systems; channel leakage power ratio; digital predistortion system; drain bias voltage; drain supply voltage; high electron mobility transistor; power amplifiers; semiconductor device fabrication; transmitter amplifier; Aluminum gallium nitride; Gallium nitride; HEMTs; High power amplifiers; Multiaccess communication; Power amplifiers; Power generation; Radiofrequency amplifiers; Transmitters; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1338818
Filename :
1338818
Link To Document :
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