• DocumentCode
    3490507
  • Title

    A time-domain SAR smart temperature sensor with −0.25∼+0.35°C inaccuracy for on-chip monitoring

  • Author

    Chen, Poki ; Wang, Kai-Ming ; Peng, Yu-Han ; Wang, Yu-Shin ; Chen, Chun-Chi

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    70
  • Lastpage
    73
  • Abstract
    The first time-domain successive approximation register (SAR) smart temperature sensor is proposed in this paper. Without using any bipolar transistor, a temperature sensor composed of temperature-dependent delay line is utilized to generate a delay time proportional to the measured temperature. A binary-weighted time reference delay line is adopted for set-point programming. The effective delay of the reference delay line is adjusted to approximate that of the temperature-dependent delay line for digital output coding through the help of SAR control logic. With 10 output bits, the proposed smart sensor owns a chip area of 0.6 mm2 in the TSMC 0.35-mum standard digital CMOS process. The consumption current is 11.12 muA and an inaccuracy of -0.25~0.35degC over 0~90degC test temperature range is achieved for 23 test chips without any dynamic element matching, curvature correction, dynamic offset cancellation or BJT device.
  • Keywords
    CMOS digital integrated circuits; delay lines; intelligent sensors; temperature measurement; temperature sensors; TSMC standard digital CMOS process; binary-weighted time reference delay line; on-chip monitoring; set-point programming; size 0.35 mum; successive approximation register; temperature measurement; temperature-dependent delay line; time-domain SAR smart temperature sensor; Bipolar transistors; Delay effects; Delay lines; Monitoring; Temperature control; Temperature measurement; Temperature sensors; Testing; Time domain analysis; Time measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
  • Conference_Location
    Edinburgh
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-2361-3
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2008.4681794
  • Filename
    4681794