Title :
Radiation and life test procedures for military and aerospace memory components
Author :
Chrusciel, Richard W.
Abstract :
The author presents part qualification, characterization and testing procedures for memory (static/dynamic RAM) components, intended for military and aerospace use. The procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems
Keywords :
DRAM chips; SRAM chips; environmental testing; integrated circuit testing; integrated memory circuits; life testing; military equipment; radiation effects; aerospace memory components; characterization; dynamic RAM; life test procedures; military components; part qualification; radiation test procedures; static RAM; Aerospace testing; Costs; DRAM chips; Electric variables measurement; Electronic equipment testing; Life testing; Production systems; Qualifications; Random access memory; Thermal stresses;
Conference_Titel :
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-4150-9
DOI :
10.1109/MT.1993.263139
