• DocumentCode
    3490524
  • Title

    A study of floating-body effects on inverter chain delay

  • Author

    Schiebel, Richard A. ; Houston, Theodore W. ; Rajgopal, Rajan ; Joyner, Keith ; Fossum, Jerry G. ; Suh, Dongwook ; Krishnan, Srinath

  • Author_Institution
    Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    1995
  • fDate
    3-5 Oct 1995
  • Firstpage
    125
  • Lastpage
    126
  • Abstract
    Sub and Fossum (1994) predicted that floating-body effects in partially depleted (PD) SOI transistors will cause the performance of a PD/SOI circuit to depend on its recent history. The voltage of the floating body affects the threshold voltage Vt which results in hysteretic dependence of leakage current and gate delay. The interactions are complex, and experimental data are needed to confirm the model and establish the significance of the effects on circuit performance. The purpose of this work is to advance understanding of hysteretic floating-body effects, the interplay of time constants involved in these processes, and their impact on circuit performance
  • Keywords
    delays; digital integrated circuits; hysteresis; integrated logic circuits; leakage currents; logic gates; silicon-on-insulator; SOI circuit performance; Si; floating-body effects; gate delay; hysteretic dependence; inverter chain delay; leakage current; partially depleted SOI transistors; threshold voltage; time constants; Circuit optimization; Delay effects; Hysteresis; Instruments; Lighting; Pulse generation; Pulse inverters; Pulse measurements; Steady-state; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    SOI Conference, 1995. Proceedings., 1995 IEEE International
  • Conference_Location
    Tucson, AZ
  • Print_ISBN
    0-7803-2547-8
  • Type

    conf

  • DOI
    10.1109/SOI.1995.526492
  • Filename
    526492