• DocumentCode
    3490542
  • Title

    Matching points in poor edge information images

  • Author

    Posse, Alberto ; Torres, Juan ; Menéndez, José Manuel

  • Author_Institution
    Grupo de Aplicacion de Telecomun. Visuales, Univ. Politec. de Madrid, Madrid, Spain
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    197
  • Lastpage
    200
  • Abstract
    Pattern matching and image patches correspondence have been described in several papers. However, in most cases the results are obtained using images with high level of detail, in other words, images with useful edge information. This paper describes a method to find correspondences between images with very poor edge information -for instance a painting with a cloudless sky- and its application to reflectographic images mosaicing. Unlike other pattern matching techniques, the proposed method solves the issue of low levels of detail or lack of good information, both needed for the determination of the correspondences used by common likeness measure (cross-norm correlation), features correspondence (Harris, SUSAN) and object recognition methods. Thus, intensity-augmented ordinal measure method is used: a window-based noise-robust method to calculate matching points. This method is improved with our Point Structure Selection (PSS) procedure to select good correspondences and reject false positives.
  • Keywords
    edge detection; image matching; image patches; matching points; object recognition methods; pattern matching; point structure selection; poor edge information images; reflectographic images mosaicing; Cameras; Computer vision; Image resolution; Layout; Noise measurement; Object recognition; Painting; Pattern matching; Radiometry; Telecommunications; Pattern matching; infrared reflectography; ordinal measure;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5414221
  • Filename
    5414221