Title : 
New SOI structures for intelligent power ICs with vertical double-diffused MOS output devices
         
        
            Author : 
Kikuchi, Hiroaki ; Hamajima, Tomohiro ; Kobayashi, Kenya ; Takashi, M. ; Arai, Kenichi
         
        
            Author_Institution : 
ULSI Device Dev. Lab., NEC Corp., Sagamihara, Japan
         
        
        
        
        
        
            Abstract : 
Intelligent power ICs with vertical double-diffused MOS (VDMOS) output devices are used for solenoid controlled applications. Many structures have been proposed for these power ICs. We have developed poly-Si sandwiched bonded (PSB) structures which use a Sb doped poly-Si and crystal-Si bonding technique. However these PSB structures have a high fabrication cost, because the fabrication process includes Sb diffusion into poly-Si layers. In this paper, we first propose an improved fabrication process of PSB structures without Sb diffusion into poly-Si layers. Second, we propose a new SOI structure with gaps fabricated by a wafer direct bonding technique. Both structures enable us to obtain low-cost intelligent power ICs with VDMOS
         
        
            Keywords : 
MOS integrated circuits; power MOSFET; power integrated circuits; silicon; silicon-on-insulator; wafer bonding; SOI structures; Si; VDMOS output devices; fabrication process; gaps; intelligent power ICs; poly-Si sandwiched bonded structures; polysilicon; vertical double-diffused MOS; wafer direct bonding technique; Annealing; Conductivity; Fabrication; Heat treatment; Intelligent structures; Power integrated circuits; Semiconductor films; Substrates; Surface topography; Wafer bonding;
         
        
        
        
            Conference_Titel : 
SOI Conference, 1995. Proceedings., 1995 IEEE International
         
        
            Conference_Location : 
Tucson, AZ
         
        
            Print_ISBN : 
0-7803-2547-8
         
        
        
            DOI : 
10.1109/SOI.1995.526496