Title :
Local Supply Voltage Adjustment for Low Power Parametric Yield Increase
Author :
Eireiner, Matthias ; Henzler, Stephan ; Georgakos, Georg ; Berthold, Joerg ; Schmitt-Landsiedel, Doris
Author_Institution :
Tech. Univ. Munich
Abstract :
A method is proposed to compensate for local delay variations by adjusting the supply voltage of individual circuit blocks. In-situ characterization of sub-blocks allows for voltage adjustment with minimum safety margin, and parametric yield can be increased with small energy overhead. Experimental results are presented for a test module based on an ARM9 core, fabricated in 130nm CMOS
Keywords :
CMOS integrated circuits; delay circuits; flip-flops; integrated circuit yield; low-power electronics; power supplies to apparatus; 130 nm; ARM9 core; dynamic voltage scaling; error prediction; individual circuit blocks; local supply voltage adjustment; low power parametric yield increase; Circuits; Clocks; Delay; Dynamic voltage scaling; Error correction; Latches; Low voltage; Monitoring; Safety; Switches; dynamic voltage scaling; error prediction; parameter variations and yield;
Conference_Titel :
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location :
Montreux
Print_ISBN :
1-4244-0303-0
DOI :
10.1109/ESSCIR.2006.307540
