Title :
An optimal march test for locating faults in DRAMs
Author :
Shen, Lin ; Cockburn, Bruce F.
Author_Institution :
Dept. of Electr. Eng., Alberta Univ., Edmonton, Alta., Canada
Abstract :
The authors solve the fault location problem for a realistic fault model that is based on the physical defects and resulting faulty behaviours observed in 4 Mbit DRAMs manufactured by Siemens. Assuming an n×1 DRAM organization, they derive a lower bound of 8n on the length of any march test that locates all of the faults in the fault model. They then propose a march test whose length matches the lower bound, and then show that this test has 100% fault coverage
Keywords :
DRAM chips; fault location; integrated circuit testing; 4 Mbit; DRAMs; Siemens; fault location problem; fault model; optimal march test; physical defects; Automata; Capacitors; Failure analysis; Fault detection; Fault diagnosis; Fault location; Random access memory; Read-write memory; Testing; Virtual manufacturing;
Conference_Titel :
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-4150-9
DOI :
10.1109/MT.1993.263148
