DocumentCode
3490676
Title
Monitors for a signal integrity measurement system
Author
Petrescu, Violeta ; Pelgrom, Marcel ; Veendrick, Harry ; Pavithran, Praveen ; Wieling, Jean
Author_Institution
Philips Res. Labs., Eindhoven
fYear
2006
fDate
Sept. 2006
Firstpage
122
Lastpage
125
Abstract
On-chip monitors are an essential part of a signal integrity measurement system. Temperature, voltage and technology monitors need to comply with various boundary conditions, such as lay-out style, available power supply and limited data communication. This paper reports 90 nm and 65 nm monitors
Keywords
integrated circuit measurement; integrated circuit testing; real-time systems; 65 nm; 90 nm; monitors; signal integrity measurement system; CMOS technology; Data communication; Power supplies; Process control; Registers; Semiconductor device measurement; Semiconductor device noise; Temperature; Testing; Wiring;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location
Montreux
ISSN
1930-8833
Print_ISBN
1-4244-0303-0
Type
conf
DOI
10.1109/ESSCIR.2006.307546
Filename
4099719
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