Title :
CMOS unclonable system for secure authentication based on device variability
Author :
Puntin, D. ; Stanzione, S. ; Iannaccone, G.
Author_Institution :
Dipt. di Ing. dell´´Inf.: Elettron., Inf., Telecomun., Univ. di Pisa, Pisa
Abstract :
An unclonable system for product authentication in anti-counterfeiting has been implemented in standard 90 nm CMOS technology. The circuit exploits the intrinsic variability of the electrical characteristics of minimum size MOSFETs, in order to generate a physical one-way function that univocally identifies each particular IC. Effects of temperature, voltage supply and process variations have been internally compensated to obtain a robust and reliable behavior. Experimental measurements show that the circuit exhibits 30 muW power consumption, a bit error rate in response to a challenge smaller than 0.4% at 125degC or with a 10% voltage supply variation. Accelerated aging tests provide an estimate of a lifetime much in excess of the ten-year requirement. The very low power consumption makes the circuit also feasible for integration in RFID transponders.
Keywords :
CMOS integrated circuits; MOSFET; integrated circuit testing; life testing; CMOS unclonable system; MOSFET; RFID transponders; anti-counterfeiting; bit error rate; power 30 muW; product authentication; secure authentication; size 90 nm; temperature 125 C; Authentication; CMOS technology; Character generation; Circuits; Electric variables; Energy consumption; MOSFETs; Robustness; Temperature; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-2361-3
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2008.4681809