DocumentCode :
3490737
Title :
Circuit techniques for suppression and measurement of on-chip inductive supply noise
Author :
Pant, Sanjay ; Blaauw, David
fYear :
2008
fDate :
15-19 Sept. 2008
Firstpage :
134
Lastpage :
137
Abstract :
Increasing power consumption and clock frequency have significantly exacerbated the Ldi/dt drop, which has emerged as the dominant fraction of the overall power supply drop in high performance designs. We present the design and validation of a high-voltage, charge-pump based active decoupling circuit for the suppression of on-chip inductive power-supply noise. We also propose a low-power, high-resolution, digital on-chip oscilloscope technique, based on repetitive sampling, for measurement of high-frequency supply noise. The proposed circuits were implemented and fabricated in a 0.13mum CMOS process. Measurement results on the prototype demonstrate 48% and 53% reduction in power supply noise for rapidly switching current-loads and during resonance, respectively. On-chip supply noise is measured using the proposed on-chip oscilloscope and the noise waveforms are compared with those obtained from a traditional supply noise monitor and direct on-chip probing using probe pads.
Keywords :
CMOS digital integrated circuits; integrated circuit measurement; integrated circuit noise; low-power electronics; power consumption; CMOS process; active decoupling circuit; circuit techniques; clock frequency; low-power high-resolution digital on-chip oscilloscope technique; on-chip inductive supply noise; power consumption; repetitive sampling; size 0.13 mum; Active noise reduction; Charge pumps; Circuit noise; Clocks; Energy consumption; Frequency; Noise measurement; Oscilloscopes; Power supplies; Sampling methods;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location :
Edinburgh
ISSN :
1930-8833
Print_ISBN :
978-1-4244-2361-3
Electronic_ISBN :
1930-8833
Type :
conf
DOI :
10.1109/ESSCIRC.2008.4681810
Filename :
4681810
Link To Document :
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