Title :
Structure property correlation of epoxy resins under the influence of moisture; and comparison of diffusion coefficient with MD-simulations
Author :
Dermitzaki, E. ; Wunderle, B. ; Bauer, J. ; Walter, H. ; Michel, B.
Author_Institution :
Dept. Mech. Reliability & Micro Mater., Fraunhofer Inst. of Reliability & Microintegration, Berlin
Abstract :
The properties of epoxy based materials alter, when exposed to humid environment and temperature. To better understand the failure mechanisms on microelectronic packaging we examine these epoxies (aromatic epoxy: l,3-Bis-(2,3-epoxypropyl)-benzene and amine hardener: 1,2-Diaminoethan ) under different initial conditions of temperature (300-400 K) & humidity (85,100 RH) and change systematically the structure (stoichiometry & molecular weight). By applying the previous conditions we perform mechanical characterization (glass transition temperature-Tg & coefficient of thermal expansion - CTE), make diffusion experiments to obtain the diffusion coefficient D , the water uptake-wt%, the hygroscopic strain epsiv and do molecular dynamics-(MD) simulations to calculate the D and compare them with experiment. Diffusion coefficients are calculated under NVT - thermodynamic boundary conditions by using a classical force-field MD. It was found that changing the free-volume and/or polarity of the structure does influence the properties and molecular dynamics predicted qualitatively the influence of structure on D.
Keywords :
diffusion; glass transition; molecular dynamics method; polymers; thermal expansion; thermodynamics; aromatic epoxy; coefficient of thermal expansion; diffusion coefficient; epoxy based materials; epoxy resins; failure mechanisms; glass transition temperature; molecular dynamics; thermodynamic boundary conditions; Capacitive sensors; Epoxy resins; Failure analysis; Glass; Humidity; Microelectronics; Moisture; Packaging; Temperature; Thermal expansion;
Conference_Titel :
Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems, 2008. EuroSimE 2008. International Conference on
Conference_Location :
Freiburg im Breisgau
Print_ISBN :
978-1-4244-2127-5
Electronic_ISBN :
978-1-4244-2128-2
DOI :
10.1109/ESIME.2008.4525087