Title :
A high-speed boundary search Shmoo plot for ULSI memories
Author :
Hamada, Mohamed ; Kumanoya, M. ; Ishii, Motoharu ; Kawagoe, Tomoya ; Niiro, Mitsutaka
Author_Institution :
LSI Lab., Mitsubishi Electr. Corp., Hyogo, Japan
Abstract :
The authors describe a new high-speed Shmoo plot algorithm for ULSI memory devices. The proposed boundary search method is 8 times faster than the conventional (linear searching) method. Using this method the evaluation time of a 64 Mbit memory is reduced to 2.5 hours from the 20 hours of the conventional method
Keywords :
VLSI; circuit analysis computing; integrated circuit testing; integrated memory circuits; search problems; Shmoo plot algorithm; ULSI memories; boundary search method; high-speed boundary search; test pattern program; Circuit testing; Decoding; Laboratories; Large scale integration; Random access memory; Search methods; Shape; Ultra large scale integration;
Conference_Titel :
Memory Testing, 1993., Records of the 1993 IEEE International Workshop on
Conference_Location :
San Jose, CA
Print_ISBN :
0-8186-4150-9
DOI :
10.1109/MT.1993.263158
