DocumentCode :
3490878
Title :
A model for ranking thermoplastic and thermosetting compounds for HV applications
Author :
Agarwal, V.K. ; Hatfield, L.L.
Author_Institution :
Dept. of Phys. & Astron., Moorhead State Univ., MN, USA
fYear :
1988
fDate :
16-20 Oct 1988
Firstpage :
116
Lastpage :
121
Abstract :
The author reports a preliminary model which allows the ranking of thermoplastic and thermosetting compounds for high-voltage applications using ASTM data on various properties. He considered only 18 of the most widely used thermoplastics and five thermosetting compounds. The dielectric and electrical properties included in the ranking are dielectric constant, dielectric loss factor, volume resistivity, and arc resistance. The mechanical and thermal properties considered are tensile strength and impact strength, deflection temperature, and maximum operating temperature. These and other properties are assigned a ranking between 1 and 5 corresponding to the material being poor if ranked 1 and very good if ranked 5. It is found that out of the materials evaluated, only a handful earned an index number in the satisfactory to good range. It is concluded that probably no solid insulating material is available which would be ranked excellent for all dielectric, electrical, mechanical, thermal, and other physical properties
Keywords :
dielectric losses; electrical conductivity; high-voltage techniques; impact strength; organic insulating materials; permittivity; plastics; tensile strength; thermal properties of substances; ASTM data; HV applications; arc resistance; deflection temperature; dielectric constant; dielectric loss factor; impact strength; maximum operating temperature; mechanical properties; ranking; solid insulating material; tensile strength; thermal properties; thermoplastic compounds; thermoplastics; thermosetting compounds; volume resistivity; Dielectric constant; Dielectric losses; Dielectric materials; Dielectrics and electrical insulation; Mechanical factors; Physics; Plastic insulation; Polymers; Solids; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation and Dielectric Phenomena, 1988. Annual Report., Conference on
Conference_Location :
Ottawa, Ont.
Type :
conf
DOI :
10.1109/CEIDP.1988.26318
Filename :
26318
Link To Document :
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