• DocumentCode
    3490930
  • Title

    Impact of ASD settings in its LVRT behaviour

  • Author

    Carrillo, C. ; Vidal-Vilarino, F. ; Suárez-Álvarez, M. ; Saez-Tort, M. ; Díaz-Dorado, E.

  • Author_Institution
    Dept. of Electr. Eng., Univ. of Vigo, Vigo, Spain
  • fYear
    2010
  • fDate
    14-16 June 2010
  • Firstpage
    339
  • Lastpage
    342
  • Abstract
    A common matter of concern in industrial installations is that adjustable-speed drives (ASD) trip due to voltage sags. ASD manufacturers are including more and more in these devices settings related to control strategies (e.g. allowable DC voltage levels, etc) in order to improve their Low Voltage Ride Through (LVRT). These settings must be carefully adjusted in each installation in order to prevent any interference with the process where ASDs are used. In this paper, a method to establish the setting values to achieve a determined LVRT level has been done. A voltage sag generator developed by the part of the authors has been used to test several setting values and its impact on the process. Two commercial ASD installed in a factory were used during tests.
  • Keywords
    power supply quality; variable speed drives; ASD setting; LVRT behaviour; Low Voltage Ride Through; adjustable speed drives; industrial installations; voltage sag generator; voltage sags; Automotive engineering; Design automation; Electronics industry; Low voltage; Manufacturing automation; Manufacturing industries; Power quality; Testing; Variable speed drives; Voltage fluctuations; Adjustable Speed Drives; Low Voltage Ride Through; Power quality; Voltage sag;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Electronics Electrical Drives Automation and Motion (SPEEDAM), 2010 International Symposium on
  • Conference_Location
    Pisa
  • Print_ISBN
    978-1-4244-4986-6
  • Electronic_ISBN
    978-1-4244-7919-1
  • Type

    conf

  • DOI
    10.1109/SPEEDAM.2010.5545109
  • Filename
    5545109