Title :
A new flicker test standard based on asynchronous sampling technology and compensation algorithm
Author :
Lei, Wang ; Shufan, Zeng ; Jiangtao, Zhang ; Lijuan, Liu ; Hao, Zhou ; Min, Li ; Zuliang, Lu ; Shaoyuan, Zhou
Author_Institution :
Harbin Inst. of Technol., Harbin, China
Abstract :
This paper described a new flicker test standard developed in National Institute of Metrology (NIM) for the calibration of voltage fluctuation and flicker. It meets the requirement of both flickermeter and flicker source according to the IEC 61000-4-15.
Keywords :
calibration; compensation; meters; IEC 61000-4-15; National Institute of Metrology; asynchronous sampling technology; compensation algorithm; flicker calibration; flicker source; flicker test standard; flickermeter; voltage fluctuation calibration; Coaxial components; Equations; IEC standards; Measurement standards; Metrology; Resistors; Sampling methods; Standards development; Testing; Voltage fluctuations;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5545110
