DocumentCode :
3491086
Title :
Study on the properties of gallium antimonide surface passivatied with S2Cl2 solution
Author :
Chen, Fang ; Liu, Guojun ; Wei, Zhipeng ; Deng, Rui ; Fang, Xuan ; Tian, Shanshan ; Zou, Yonggang ; Li, Mei ; Ma, Xiaohui
Author_Institution :
Nat. Key Lab. of High-Power Semicond. Lasers, Changchun Univ. of Sci. & Technol., Changchun, China
fYear :
2012
fDate :
23-25 Aug. 2012
Firstpage :
21
Lastpage :
24
Abstract :
The surface optical and chemical properties of gallium antimonide (GaSb) surfaces after dichloride disulfide (S2Cl2) and ammonium sulfide ((NH4)2S) treatments were compared. Photoluminescence (PL) spectroscopy is used to study the GaSb surfaces passivated by S2Cl2 comparing to (NH4)2S solution, meanwhile, quantitative comparison using x-ray photoelectron spectroscopy (XPS) demonstrates that S2Cl2 passivation dramatically improves the stability against reoxidation in air compared with the (NH4)2S solution. We found that S2Cl2 method is quite effective for removing oxides of GaSb surface, besides, PL intensity of S2Cl2-passivated sample was higher than (NH4)2S-passivated sample, and stability of S2Cl2-passivated sample was also more sustained. Overall, S2Cl2 provides to be superior passivation for III-V compound semiconductor material promising for high-speed and optoelectronic device applications.
Keywords :
III-V semiconductors; X-ray photoelectron spectra; gallium compounds; oxidation; passivation; photoluminescence; spectral line intensity; surface structure; GaSb; III-V compound semiconductor material; PL intensity; X-ray photoelectron spectroscopy; XPS; ammonium sulfide treatments; dichloride disulfide treatments; gallium antimonide surface passivation; high-speed device applications; optoelectronic device applications; photoluminescence spectroscopy; reoxidation; surface chemical properties; surface optical properties; Materials; Microelectronics; Optical surface waves; Passivation; Photoluminescence; Spectroscopy; (NH4)2S solution; GaSb surface; S2Cl2-passivated; photoluminescence;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optoelectronics and Microelectronics (ICOM), 2012 International Conference on
Conference_Location :
Changchun, Jilin
Print_ISBN :
978-1-4673-2638-4
Type :
conf
DOI :
10.1109/ICoOM.2012.6316206
Filename :
6316206
Link To Document :
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