Title :
An 8-bit Flash Analog-to-Digital Converter in standard CMOS technology functional in ultra wide temperature range from 4.2 K to 300 K
Author :
Creten, Y. ; Merken, P. ; Mertens, R. ; Sansen, W. ; Van Hoof, Chris
Author_Institution :
IMEC, Leuven
Abstract :
This paper presents the first standard CMOS flash analog-to-digital converter (ADC) operational over an ultra wide temperature range (UWT) from room temperature (27deg C or 300 K) down to 4 K (-269deg C). To preserve the circuits performance over the UWT range in the presence of temperature induced transistor anomalies, dedicated architecture and switching schemes are employed.
Keywords :
CMOS integrated circuits; analogue-digital conversion; semiconductor device reliability; UWT range; flash analog-to-digital converter; standard CMOS technology; switching scheme; temperature 4.2 K to 300 K; temperature induced transistor anomaly; ultra wide temperature range; word length 8 bit; Analog-digital conversion; CMOS technology; Circuits; Cryogenics; Hysteresis; MOSFETs; Sensor arrays; Temperature dependence; Temperature distribution; Temperature sensors;
Conference_Titel :
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-2361-3
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2008.4681845
