• DocumentCode
    3491274
  • Title

    Margin and domain integrated classification

  • Author

    Chen, Yen-Lun ; Zheng, Yuan F.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    2061
  • Lastpage
    2064
  • Abstract
    Multi-category classification is an ongoing research topic with numerous applications. In this paper, a novel approach called margin and domain integrated classifier (MDIC) is addressed. It handles multi-class problems as a combination of several target classes plus outliers. The basic idea behind the proposed approach is that target classes possess structured characteristics while outliers scatter around in the feature space. In our approach the domain description and large-margin discrimination are adjustable and therefore higher classification accuracy leads to better performance. The properties of MDIC are analyzed and the performance comparisons using synthetic and real data are presented.
  • Keywords
    pattern classification; support vector machines; domain description; large margin discrimination; margin-domain integrated classification; multicategory classification; outliers; Application software; Face recognition; Handwriting recognition; Machine learning; Object recognition; Pattern classification; Performance analysis; Scattering; Support vector machine classification; Support vector machines; Pattern classification; multi-category classification; support vector domain description (SVDD); support vector machine (SVM);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5414267
  • Filename
    5414267