DocumentCode
3491274
Title
Margin and domain integrated classification
Author
Chen, Yen-Lun ; Zheng, Yuan F.
Author_Institution
Dept. of Electr. & Comput. Eng., Ohio State Univ., Columbus, OH, USA
fYear
2009
fDate
7-10 Nov. 2009
Firstpage
2061
Lastpage
2064
Abstract
Multi-category classification is an ongoing research topic with numerous applications. In this paper, a novel approach called margin and domain integrated classifier (MDIC) is addressed. It handles multi-class problems as a combination of several target classes plus outliers. The basic idea behind the proposed approach is that target classes possess structured characteristics while outliers scatter around in the feature space. In our approach the domain description and large-margin discrimination are adjustable and therefore higher classification accuracy leads to better performance. The properties of MDIC are analyzed and the performance comparisons using synthetic and real data are presented.
Keywords
pattern classification; support vector machines; domain description; large margin discrimination; margin-domain integrated classification; multicategory classification; outliers; Application software; Face recognition; Handwriting recognition; Machine learning; Object recognition; Pattern classification; Performance analysis; Scattering; Support vector machine classification; Support vector machines; Pattern classification; multi-category classification; support vector domain description (SVDD); support vector machine (SVM);
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location
Cairo
ISSN
1522-4880
Print_ISBN
978-1-4244-5653-6
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2009.5414267
Filename
5414267
Link To Document