DocumentCode
3491281
Title
Application of S-graphs for modeling systems of metrological procurement and control
Author
Palchun, Yu.A. ; Elistratova, I.B. ; Yakimova, I.V. ; Zemtsov, S.P. ; Kvitkova, I.G.
fYear
2012
fDate
2-4 Oct. 2012
Firstpage
73
Lastpage
77
Abstract
Graphical representation of systems of metrological procurement and production control is based on using structure diagram where elements have 2n poles. These elements can be represented as directed graphs. To obtain graphical models one can use S-graph structures based on scattering matrices. The matrices contain all information on the system behavior, satisfy probabilities normalization requirement and causality principle.
Keywords
S-matrix theory; directed graphs; procurement; production control; 2n pole; S-graph structure; causality principle; directed graph; graphical model; graphical system representation; metrological procurement modeling system; probability normalization requirement satisfaction; production control; scattering matrix; structure diagram; Silicon compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location
Novosibirsk
Print_ISBN
978-1-4673-2842-5
Type
conf
DOI
10.1109/APEIE.2012.6628959
Filename
6628959
Link To Document