• DocumentCode
    3491372
  • Title

    Wavelet Leader multifractal analysis for texture classification

  • Author

    Wendt, Herwig ; Abry, Patrice ; Jaffard, Stéphane ; Ji, Hui ; Shen, Zuowei

  • Author_Institution
    Math. Dept., Purdue Univ., West Lafayette, IN, USA
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    3829
  • Lastpage
    3832
  • Abstract
    Image classification often relies on texture characterization. Yet texture characterization has so far rarely been based on a true 2D multifractal analysis. Recently, a 2D wavelet Leader based multifractal formalism has been proposed. It allows to perform an accurate, complete and low computational and memory costs multifractal characterization of textures in images. This contribution describes the first application of such a formalism to a real large size (publicly available) image database, consisting of 25 classes of non traditional textures, with 40 high resolution images in each class. Multifractal attributes are estimated from each image and used as classification features within a standard k nearest neighbor classification procedure. The results reported here show that this Leader based multifractal analysis enables the effective discrimination of different textures, as performances in both classification scores and computational costs compare favorably against those of procedures previously proposed in the literature on the same database.
  • Keywords
    fractals; image classification; image texture; wavelet transforms; 2D multifractal analysis; image classification; k nearest neighbor classification; texture classification; wavelet leader multifractal analysis; Computational efficiency; Fractals; Image classification; Image databases; Image resolution; Image texture analysis; Nearest neighbor searches; Performance analysis; Spatial databases; Wavelet analysis; Image Classification; Image Multifractal Analysis; Texture Characterization; Wavelet Leader;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5414273
  • Filename
    5414273