Title :
Reduction of VCO phase noise through forward substrate biasing of switched MOSFETs
Author :
Siprak, Domagoj ; Tiebout, Marc ; Baumgartner, Peter
Author_Institution :
Infineon Technol. AG, Neubiberg
Abstract :
A reduction of close to carrier phase noise of a 14 GHz PMOS VCO is presented by forward substrate biasing the MOSFETs providing the oscillation in the VCO. This finding is explained by the physical effect of significantly reduced 1/f noise in transistors operated under large signal excitation and forward substrate bias. Measurements of MOSFET 1/f noise under switched gate bias condition and VCO phase noise are presented to explain the dependency between reduced 1/f noise and reduced VCO phase noise with forward substrate bias.
Keywords :
1/f noise; MOSFET; microwave oscillators; phase noise; semiconductor device noise; voltage-controlled oscillators; 1/f noise reduction; VCO phase noise; forward substrate biasing; frequency 14 GHz; switched MOSFET; switched gate bias condition; transistor operation; CMOS technology; Circuit noise; MOSFETs; Noise cancellation; Noise measurement; Noise reduction; Phase measurement; Phase noise; Radio frequency; Voltage-controlled oscillators;
Conference_Titel :
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
Conference_Location :
Edinburgh
Print_ISBN :
978-1-4244-2361-3
Electronic_ISBN :
1930-8833
DOI :
10.1109/ESSCIRC.2008.4681858