• DocumentCode
    3491447
  • Title

    Reduction of VCO phase noise through forward substrate biasing of switched MOSFETs

  • Author

    Siprak, Domagoj ; Tiebout, Marc ; Baumgartner, Peter

  • Author_Institution
    Infineon Technol. AG, Neubiberg
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    326
  • Lastpage
    329
  • Abstract
    A reduction of close to carrier phase noise of a 14 GHz PMOS VCO is presented by forward substrate biasing the MOSFETs providing the oscillation in the VCO. This finding is explained by the physical effect of significantly reduced 1/f noise in transistors operated under large signal excitation and forward substrate bias. Measurements of MOSFET 1/f noise under switched gate bias condition and VCO phase noise are presented to explain the dependency between reduced 1/f noise and reduced VCO phase noise with forward substrate bias.
  • Keywords
    1/f noise; MOSFET; microwave oscillators; phase noise; semiconductor device noise; voltage-controlled oscillators; 1/f noise reduction; VCO phase noise; forward substrate biasing; frequency 14 GHz; switched MOSFET; switched gate bias condition; transistor operation; CMOS technology; Circuit noise; MOSFETs; Noise cancellation; Noise measurement; Noise reduction; Phase measurement; Phase noise; Radio frequency; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
  • Conference_Location
    Edinburgh
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-2361-3
  • Electronic_ISBN
    1930-8833
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2008.4681858
  • Filename
    4681858