DocumentCode :
349167
Title :
An integrated diagnostic reconfiguration (IDR) technique for fault tolerant mixed signal microsystems
Author :
Sharif, Erfaan ; Dorey, Tony ; Richardson, Andrew
Author_Institution :
Dept. of Eng., Lancaster Univ., UK
Volume :
1
fYear :
1998
fDate :
1998
Firstpage :
413
Abstract :
An integrated diagnostic reconfiguration (IDR) approach is presented for mixed signal systems used in high dependability applications. The technique eliminates the need for multiple redundant devices. The approach has been used to implement a fault tolerant interface ASIC for a smart piezoresistive silicon pressure sensor used in an automotive application. The ASIC hardware has been combined with software modules implemented on a RISC microcontroller embedded in universal sensor interface circuit (USIC) to produce a working demonstrator. The conclusions considers limitations, benefits and further possible applications for the technique
Keywords :
automotive electronics; fault tolerance; integrated circuit testing; microcontrollers; mixed analogue-digital integrated circuits; piezoelectric transducers; piezoresistive devices; pressure sensors; redundancy; RISC microcontroller; automotive application; fault tolerant interface ASIC; fault tolerant mixed signal microsystems; high dependability applications; integrated diagnostic reconfiguration; multiple redundant devices; piezoresistive pressure sensor; universal sensor interface circuit; Application software; Application specific integrated circuits; Automotive applications; Circuit faults; Embedded software; Fault tolerance; Hardware; Intelligent sensors; Piezoresistance; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 1998 IEEE International Conference on
Conference_Location :
Lisboa
Print_ISBN :
0-7803-5008-1
Type :
conf
DOI :
10.1109/ICECS.1998.813352
Filename :
813352
Link To Document :
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