Title :
On-chip Real-Time Power Supply Noise Detector
Author :
Sehgal, Anuja ; Song, Peilin ; Jenkins, Keith A.
Author_Institution :
IBM T.J. Watson Res. Center, Yorktown Heights, NY
Abstract :
A new on-chip real-time noise detector that can be used for detecting voltage surges and droops on the internal power supply of VSLI circuits is presented. The noise detector is compact, and has the ability of detecting dc levels and high frequency on-chip transients of the power supply voltage. The detector has been implemented in a 90 nm CMOS technology, and has an area of 50times100 mum2. The measured results show that the detector can detect overshoots and undershoots of less than 1 ns, and as small as 20 mV
Keywords :
CMOS integrated circuits; VLSI; integrated circuit measurement; integrated circuit noise; noise measurement; power supply circuits; sensors; surges; transients; 100 micron; 50 micron; 90 nm; CMOS technology; VSLI circuits; dc levels; droops; internal power supply; on-chip transients; power supply noise; real-time noise detector; voltage surges; CMOS technology; Circuit noise; Circuit testing; Detectors; Integrated circuit noise; Power supplies; Sensor systems; System-on-a-chip; Temperature sensors; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location :
Montreux
Print_ISBN :
1-4244-0303-0
DOI :
10.1109/ESSCIR.2006.307610
