DocumentCode :
3491913
Title :
Corrections for nonlinear vector network analyzer measurements using a stochastic multi-line/reflect method
Author :
DeGroo, Donald C. ; Rolain, Yves ; Pintelon, Rik ; Schoukens, Johan
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Volume :
3
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
1735
Abstract :
A new 16-term statistical calibration has been developed for the correction of the vector network analyzer (VNA) data. The method uses multiple measurements of generic transmission line and reflection standards. Using a functional model of the system and transmission line standards, we apply a nonlinear least-squares estimator to simultaneously optimize the correction terms in the measurement model and the propagation constant. The method provide estimates of the uncertainty on each of the parameters using the final Jacobian. This paper shows for the first time an application of the new calibration to a commercial nonlinear VNA, plus quantitative statements regarding the quality of the parameters.
Keywords :
calibration; least squares approximations; measurement uncertainty; microwave measurement; network analysers; 16-term statistical calibration; VNA data correction; final Jacobian; generic transmission line; measurement calibration; multiple measurements; nonlinear least-squares estimator; nonlinear vector network analyzer measurements; propagation constant; reflection standards; stochastic multiline method; stochastic multireflect method; Acoustic scattering; Calibration; Measurement standards; Microwave measurements; Noise measurement; Propagation constant; Reflection; Scattering parameters; Stochastic processes; Transmission line measurements;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1338930
Filename :
1338930
Link To Document :
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