Title :
Extended NVNA bandwidth for long-term memory measurements
Author :
Remley, Kate A. ; Schreurs, Dominique M M P ; Williams, Dylan F. ; Wood, John
Author_Institution :
Nat. Inst. of Stand. & Technol., Boulder, CO, USA
Abstract :
We present a technique for measuring the magnitude and phase intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory, and relate our measurements to frequency-dependent physical characteristics of the circuitry.
Keywords :
intermodulation distortion; microwave measurement; network analysers; phase measurement; extended NVNA bandwidth; frequency-dependent physical characteristics; intermodulation distortion; long-term memory measurements; magnitude measurement; measurement bandwidth; nonlinear vector network analyzer; phase intermodulation products; Bandwidth; Circuits; Distortion measurement; Frequency conversion; Frequency measurement; HEMTs; MODFETs; Phase measurement; Radio frequency; mHEMTs;
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Print_ISBN :
0-7803-8331-1
DOI :
10.1109/MWSYM.2004.1338931
