DocumentCode
3491936
Title
Improvements of AC/DC calculable standard resistor with double helix arrangement and Kelvin resistance bridge at NIM
Author
Lu, Huang ; Yan, Yang ; Wei, Wang ; Zhengwei, Qu ; Zhengkun, Li
Author_Institution
Nat. Inst. of Metrol., Beijing, China
fYear
2010
fDate
13-18 June 2010
Firstpage
372
Lastpage
373
Abstract
In order to calibrate the frequency dependence of ac standard resistor more accurately, improvements of double helix standard resistor and Kelvin resistance bridge at NIM are made and described in this paper. The experimental results show that the dc resistance stability of the AC/DC calculable resistor is enhanced by one order and the measurement uncertainty of the bridge is decreased.
Keywords
electric resistance measurement; measurement uncertainty; resistors; AC-DC calculable standard resistor; Kelvin resistance bridge; NIM; calibration; double helix standard resistor; frequency dependence; measurement uncertainty; Aluminum; Automatic control; Bridge circuits; Circuit stability; Frequency; Kelvin; Measurement standards; Resistors; Thermal resistance; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location
Daejeon
Print_ISBN
978-1-4244-6795-2
Type
conf
DOI
10.1109/CPEM.2010.5545236
Filename
5545236
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