A hybrid de-embedding technique and its application for FSS characterization

To compensate the loss or impedance discontinuity of test fixture, a hybrid technique is proposed by characterizing the test fixture through modelling and applying the model for device de-embedding. The technique applied to reveal the de-embedded characteristics of the device under test (DUT) uses the test fixture that cascaded with half structure models. By simulating each half of the test fixture structure to obtain its S parameters, S or T parameters matrix calculations is then used to de-embed the DUT. This is possible since for this type of test fixture it is possible to very accurately simulate its transmission and reflection response using commercially available 3D electromagnetic (EM) software.