Title : 
A 2.4-GHz +25dBm P-1dB linear power amplifier with dynamic bias control in a 65-nm CMOS process
         
        
            Author : 
Wang, Po-Chih ; Huang, Kai-Yi ; Kuo, Yu-Fu ; Huang, Ming-Chong ; Lu, Chao-Hua ; Chen, Tzung-Ming ; Chang, Chia-Jun ; Chan, Ka-Un ; Yeh, Ta-Hsun ; Wang, Wen-Shan ; Lin, Ying-Hsi ; Lee, Chao-Cheng
         
        
            Author_Institution : 
Realtek Semicond. Corp., Hsinchu
         
        
        
        
        
        
            Abstract : 
A 2.4 GHz linear CMOS power amplifier (PA) for OFDM WLAN application in 65 nm CMOS technology is presented. The cascode PA operating from 3.3 V employs the proposed asymmetric lightly doped drain MOSFET (A-LDD) structure as common-gate stage to sustain large signal stress and 1.2 V core device as common source stage to provide high frequency operation. Beside, dynamic bias technique is used not only to increase efficiency but also improve the linearity. In the measurement, the breakdown voltage of the A-LDD MOSFET can achieve 6.2 V compared to standard I/O device of 5 V. A PA EVM of -29 dB is achieved at output power of 17 dBm with DC current of 173 mA from 3.3 V supply. Also, it reveals the output P1 dB of PA is 25.3 dBm.
         
        
            Keywords : 
CMOS analogue integrated circuits; OFDM modulation; UHF power amplifiers; electric breakdown; wireless LAN; OFDM WLAN application; asymmetric lightly doped drain MOSFET; breakdown voltage; cascode PA operation; current 173 mA; dynamic bias control; frequency 2.4 GHz; linear CMOS power amplifier; size 65 nm; voltage 1.2 V; voltage 3.3 V; voltage 5 V; CMOS process; CMOS technology; Current measurement; Linearity; MOSFET circuits; OFDM; Power amplifiers; Power measurement; Stress; Wireless LAN;
         
        
        
        
            Conference_Titel : 
Solid-State Circuits Conference, 2008. ESSCIRC 2008. 34th European
         
        
            Conference_Location : 
Edinburgh
         
        
        
            Print_ISBN : 
978-1-4244-2361-3
         
        
            Electronic_ISBN : 
1930-8833
         
        
        
            DOI : 
10.1109/ESSCIRC.2008.4681899