DocumentCode
3492311
Title
The thru-line-symmetry (TLS) calibration method for on-wafer scattering matrix measurement of four-port networks
Author
Lu, Hsin-Chia ; Chu, Tah-Hsiung
Author_Institution
Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
Volume
3
fYear
2004
fDate
6-11 June 2004
Firstpage
1801
Abstract
The multimode TRL calibration method is known as an approach for the measurement of multi-conductor transmission line devices. The propagation constants of different modes propagating along the multi-conductor transmission line must be different using this method. However, in general multi-port networks, the propagating constants at each port may be equal. We here then present the thru-line symmetry (TLS) calibration method for the calibration of the equal propagation constant case. The calibration equations with the associated calibrators for on-wafer scattering matrix measurement of four-port network are developed. The measured scattering matrix of a branch line coupler using proposed calibration method shows good agreement with simulation. This method can also be extended for the calibration of multi-port networks.
Keywords
S-parameters; calibration; microwave measurement; multiport networks; branch line coupler; calibration equations; four-port networks; multiconductor transmission line devices; multimode TRL calibration; multiport networks; on-wafer scattering matrix measurement; propagation constants; scattering parameters measurement; thru-line-symmetry calibration; Calibration; Conductors; Electric variables measurement; Electronic mail; Equations; Multiconductor transmission lines; Propagation constant; Scattering; Transmission line matrix methods; Transmission lines;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN
0149-645X
Print_ISBN
0-7803-8331-1
Type
conf
DOI
10.1109/MWSYM.2004.1338952
Filename
1338952
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