• DocumentCode
    3492323
  • Title

    Classification of the visual evoked EEG using multiresolution approximation based on excitatory post-synaptic potential waveform

  • Author

    Çelik, Umut ; Anca, Sami

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Cukurova Univ., Adana, Turkey
  • fYear
    2010
  • fDate
    17-20 Nov. 2010
  • Abstract
    We classify P300 speller paradigm electroencephalogram (EEG) data from publicly available BCI competition III data sets by using multiresolution approximation. We build a scaling-wavelet function pair and its bi-orthogonal complement by resembling the waveform of the scaling function to excitatory post-synaptic potential (EPSP). The approximation coefficients of the VEPs are obtained by the custom scaling function, and the approximation coefficients of the training set are fed to a Fisher´s linear classifier to predict the symbols in the test set. The performance of classification is about 91% for 15 repetitions per letter. These results show that the classification performance of our technique is comparable with the performance of the competition results.
  • Keywords
    brain-computer interfaces; electroencephalography; eye; medical signal processing; neurophysiology; signal classification; visual evoked potentials; BCI competition III data sets; Fishers linear classifier; P300 speller paradigm electroencephalogram data; approximation coefficients; biorthogonal complement; classification performance; custom scaling function; excitatory post-synaptic potential waveform; multiresolution approximation; scaling-wavelet function pair; visual evoked EEG; Accuracy; Approximation methods; Electric potential; Electrodes; Electroencephalography; Feature extraction; Signal resolution; Electroencephalogram; Excitatory Postsynaptic Potential; Linear Discriminant Analysis; Multiresolution Approximation; Visual Event Related Potential;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel (IEEEI), 2010 IEEE 26th Convention of
  • Conference_Location
    Eliat
  • Print_ISBN
    978-1-4244-8681-6
  • Type

    conf

  • DOI
    10.1109/EEEI.2010.5661941
  • Filename
    5661941