• DocumentCode
    3492377
  • Title

    Broadband complex permittivity measurements of dielectric substrates using a split-cylinder resonator

  • Author

    Janezic, Michael D. ; Kuester, Edward F. ; Jarvis, J.B.

  • Author_Institution
    Electromagn. Div., Colorado Univ., Boulder, CO, USA
  • Volume
    3
  • fYear
    2004
  • fDate
    6-11 June 2004
  • Firstpage
    1817
  • Abstract
    We discuss a theoretical model describing the split-cylinder resonator for non-destructive measurement of a dielectric substrate´s relative permittivity and loss tangent. This improved model properly accounts for the fringing electric and magnetic fields in the dielectric substrate. Previously, the split-cylinder resonator has been used for single-frequency permittivity and loss tangent measurements using only the fundamental TE011 resonant mode. By including high-order TE0np modes, we demonstrate how to measure the relative permittivity and loss tangent of dielectric substrates over an extended frequency range. We validated the new model by measuring the permittivity and loss tangent of fused-silica substrates from 10 to 50 GHz and comparing with results obtained with circular-cylindrical cavity, a dielectric-post resonator, and several split-post resonators.
  • Keywords
    cavity resonators; dielectric materials; dielectric resonators; microwave measurement; permittivity measurement; 10 to 50 GHz; TE011 resonant mode; cavity resonator; circular-cylindrical cavity; dielectric substrates; dielectric-post resonator; fringing electric fields; fused-silica substrates; high-order TE0np modes; loss tangent measurements; magnetic fields; nondestructive measurement; permittivity measurements; relative permittivity; split-cylinder resonator; theoretical model; Dielectric loss measurement; Dielectric losses; Dielectric measurements; Dielectric substrates; Frequency measurement; Loss measurement; Magnetic field measurement; Magnetic resonance; Permittivity measurement; Tellurium;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2004 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-8331-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2004.1338956
  • Filename
    1338956