DocumentCode :
3492403
Title :
Subwavelength-resolution imaging device based on frequency scanning
Author :
Maslovski, Stanislav ; Alitalo, Pekka ; Tretyakov, Sergei
Author_Institution :
St. Petersburg State Tech. Univ., St. Petersburg
fYear :
2008
fDate :
16-20 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
A new principle of microwave, millimeter wave, and optical subwavelength imaging based on frequency scanning is described. The role of the imaging device ldquosensorrdquo is played by one or several electrically dense arrays of subwavelength-sized resonant particles. The array is illuminated by a probe electromagnetic wave whose frequency scans over the whole band of resonating array modes. During the scan it is enough to measure and store the values of the near field behind the array at one or at most two points. After the scan the spatial distribution of the near field in the array plane can be reconstructed with simple post-processing. Due to the resonant response of the array, the proposed device enhances evanescent fields created by imaging objects, which makes it is similar to super-lenses based on the use of metamaterials.
Keywords :
image reconstruction; image sensors; metamaterials; electromagnetic wave; evanescent fields; frequency scanning; imaging device sensor; metamaterials; optical subwavelength imaging; resonating array modes; subwavelength-sized resonant particles; superlenses; Electromagnetic measurements; Electromagnetic scattering; Frequency; Image reconstruction; Microwave devices; Microwave imaging; Optical imaging; Optical surface waves; Probes; Resonance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
Type :
conf
DOI :
10.1109/APMC.2008.4958611
Filename :
4958611
Link To Document :
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