DocumentCode :
3492584
Title :
A CAD approach based on artificial neural networks for conductor- backed edge coupled coplanar waveguides
Author :
Selvan, P. Thiruvalar ; Raghavan, S. ; Suganthi, S.
Author_Institution :
Dept. of Electron. & Commun. Eng., Nat. Inst. of Technol., Tiruchirappalli
fYear :
2008
fDate :
16-20 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
In this paper, a new conformal mapping quasi static approximation method based on ANNs is used to calculate accurately the odd-and even-mode characteristic impedances, coupling coefficient and effective permittivities of CB-ECCPWs. ANNs have been recently recognized as a fast and flexible tool for RF and microwave modeling, analysis and design. ANN models are developed from measured or simulated microwave data training process. Resulting ANN models are used in place of CPU-intensive theoretical for fast accurate microwave design, analysis and optimization. The ANN employed in this paper is the MLPNN. Four learning algorithms BR, LM, QN and SCG are used to train the MLPNNs. These learning algorithms are employed to obtain better performance and faster convergence with simpler structure.
Keywords :
CAD; coplanar waveguides; electrical engineering computing; learning (artificial intelligence); neural nets; BR learning algorithm; CAD approach; LM learning algorithm; QN learning algorithm; SCG learning algorithm; artificial neural networks; conductor-backed edge coupled coplanar waveguides; conformal mapping quasi static approximation method; coupling coefficient; effective permittivities; even-mode characteristic impedances; microwave data training process; microwave modeling; odd-mode characteristic impedances; Approximation methods; Artificial neural networks; Conformal mapping; Convergence; Coplanar waveguides; Design optimization; Impedance; Microwave measurements; Permittivity measurement; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
Type :
conf
DOI :
10.1109/APMC.2008.4958620
Filename :
4958620
Link To Document :
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